Ho-Sun Shon, Erdenebileg Batbaatar, Wan-Sup Cho, Seong Gon Choi. Unsupervised Pre-Training of Imbalanced Data for Identification of Wafer Map Defect Patterns. IEEE Access, 9:52352-52363, 2021. [doi]
@article{ShonBCC21,
title = {Unsupervised Pre-Training of Imbalanced Data for Identification of Wafer Map Defect Patterns},
author = {Ho-Sun Shon and Erdenebileg Batbaatar and Wan-Sup Cho and Seong Gon Choi},
year = {2021},
doi = {10.1109/ACCESS.2021.3068378},
url = {https://doi.org/10.1109/ACCESS.2021.3068378},
researchr = {https://researchr.org/publication/ShonBCC21},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {9},
pages = {52352-52363},
}