Unsupervised Pre-Training of Imbalanced Data for Identification of Wafer Map Defect Patterns

Ho-Sun Shon, Erdenebileg Batbaatar, Wan-Sup Cho, Seong Gon Choi. Unsupervised Pre-Training of Imbalanced Data for Identification of Wafer Map Defect Patterns. IEEE Access, 9:52352-52363, 2021. [doi]

Abstract

Abstract is missing.