Yening Shu, Saptarshi Mukherjee, Tammy Chang, Abigail Gilmore, Joseph W. Tringe, David Stobbe, Kenneth J. Loh. Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography. Sensors, 22(23):9167, 2022. [doi]
@article{ShuMCGTSL22,
title = {Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography},
author = {Yening Shu and Saptarshi Mukherjee and Tammy Chang and Abigail Gilmore and Joseph W. Tringe and David Stobbe and Kenneth J. Loh},
year = {2022},
doi = {10.3390/s22239167},
url = {https://doi.org/10.3390/s22239167},
researchr = {https://researchr.org/publication/ShuMCGTSL22},
cites = {0},
citedby = {0},
journal = {Sensors},
volume = {22},
number = {23},
pages = {9167},
}