Yening Shu, Saptarshi Mukherjee, Tammy Chang, Abigail Gilmore, Joseph W. Tringe, David Stobbe, Kenneth J. Loh. Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography. Sensors, 22(23):9167, 2022. [doi]
Abstract is missing.