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x dielectric stacks for failure analysis

Kalya Shubhakar, Michel Bosman, O. A. Neucheva, Y. C. Loke, Nagarajan Raghavan, R. Thamankar, A. Ranjan, Sean J. O'Shea, K. L. Pey. x dielectric stacks for failure analysis. Microelectronics Reliability, 55(9-10):1450-1455, 2015. [doi]

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