Ahish Shylendra, Swarup Bhunia, Amit Ranjan Trivedi. Intrinsic and Database-free Watermarking in ICs by Exploiting Process and Design Dependent Variability in Metal-Oxide-Metal Capacitances. In Proceedings of the International Symposium on Low Power Electronics and Design, ISLPED 2018, Seattle, WA, USA, July 23-25, 2018. ACM, 2018. [doi]
Abstract is missing.