Ahish Shylendra, Priyesh Shukla, Swarup Bhunia, Amit Ranjan Trivedi. Fault Attack Detection in AES by Monitoring Power Side-Channel Statistics. In 21st International Symposium on Quality Electronic Design, ISQED 2020, Santa Clara, CA, USA, March 25-26, 2020. pages 219-224, IEEE, 2020. [doi]
Abstract is missing.