Defect Detection of Wood Grain Images with Image Gradient Applied to AE-based generation

Jongwook Si, Sungyoung Kim. Defect Detection of Wood Grain Images with Image Gradient Applied to AE-based generation. In 6th IEEE International Conference on Knowledge Innovation and Invention, ICKII 2023, Sapporo, Japan, August 11-13, 2023. pages 335-337, IEEE, 2023. [doi]

Authors

Jongwook Si

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Sungyoung Kim

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