Jongwook Si, Sungyoung Kim. Defect Detection of Wood Grain Images with Image Gradient Applied to AE-based generation. In 6th IEEE International Conference on Knowledge Innovation and Invention, ICKII 2023, Sapporo, Japan, August 11-13, 2023. pages 335-337, IEEE, 2023. [doi]
@inproceedings{SiK23, title = {Defect Detection of Wood Grain Images with Image Gradient Applied to AE-based generation}, author = {Jongwook Si and Sungyoung Kim}, year = {2023}, doi = {10.1109/ICKII58656.2023.10332785}, url = {https://doi.org/10.1109/ICKII58656.2023.10332785}, researchr = {https://researchr.org/publication/SiK23}, cites = {0}, citedby = {0}, pages = {335-337}, booktitle = {6th IEEE International Conference on Knowledge Innovation and Invention, ICKII 2023, Sapporo, Japan, August 11-13, 2023}, publisher = {IEEE}, isbn = {979-8-3503-2353-5}, }