Xiaosheng Si, Tian-Mei Li 0001, Qi Zhang, Changhua Hu. Prognostics for Linear Stochastic Degrading Systems With Survival Measurements. IEEE Transactions on Industrial Electronics, 67(4):3202-3215, 2020. [doi]
@article{SiLZH20,
title = {Prognostics for Linear Stochastic Degrading Systems With Survival Measurements},
author = {Xiaosheng Si and Tian-Mei Li 0001 and Qi Zhang and Changhua Hu},
year = {2020},
doi = {10.1109/TIE.2019.2908617},
url = {https://doi.org/10.1109/TIE.2019.2908617},
researchr = {https://researchr.org/publication/SiLZH20},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {67},
number = {4},
pages = {3202-3215},
}