Prognostics for Linear Stochastic Degrading Systems With Survival Measurements

Xiaosheng Si, Tian-Mei Li 0001, Qi Zhang, Changhua Hu. Prognostics for Linear Stochastic Degrading Systems With Survival Measurements. IEEE Transactions on Industrial Electronics, 67(4):3202-3215, 2020. [doi]

Abstract

Abstract is missing.