Evaluation of materials using a rule-based non-destructive monitoring system (abstract)

Khalid J. Siddiqui, D. R. Hay, Ching Y. Suen. Evaluation of materials using a rule-based non-destructive monitoring system (abstract). In Lawrence A. Jehn, Larry A. Crum, editors, Proceedings of the 14th ACM Annual Conference on Computer Science, Cincinnati, Ohio, USA, 1986. pages 459, ACM, 1986. [doi]

Authors

Khalid J. Siddiqui

This author has not been identified. Look up 'Khalid J. Siddiqui' in Google

D. R. Hay

This author has not been identified. Look up 'D. R. Hay' in Google

Ching Y. Suen

This author has not been identified. Look up 'Ching Y. Suen' in Google