Khalid J. Siddiqui, D. R. Hay, Ching Y. Suen. Evaluation of materials using a rule-based non-destructive monitoring system (abstract). In Lawrence A. Jehn, Larry A. Crum, editors, Proceedings of the 14th ACM Annual Conference on Computer Science, Cincinnati, Ohio, USA, 1986. pages 459, ACM, 1986. [doi]
Abstract is missing.