A 7-Nm Dual Port 8T SRAM with Duplicated Inter-Port Write Data to Mitigate Write Disturbance - researchr publication

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M. Sultan M. Siddiqui, Sumit Srivastav, Dattatray Ramrao Wanjul, Manankumar Suthar, Sudhir Kumar. A 7-Nm Dual Port 8T SRAM with Duplicated Inter-Port Write Data to Mitigate Write Disturbance. In 31st International Conference on VLSI Design and 17th International Conference on Embedded Systems, VLSID 2018, Pune, India, January 6-10, 2018. pages 266-270, IEEE Computer Society, 2018. [doi]

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