A 500-MS/s 8.4-ps Double-Edge Successive Approximation TDC in 65 nm CMOS

Rashed Siddiqui, Fei Yuan, Yushi Zhou. A 500-MS/s 8.4-ps Double-Edge Successive Approximation TDC in 65 nm CMOS. In Hoi Lee, Randall L. Geiger, editors, 62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019. pages 770-773, IEEE, 2019. [doi]

Abstract

Abstract is missing.