Noise properties of the inverse π-scheme exponential radon transform

Emil Y. Sidky, Chien-Min Kao, Patrick J. La Rivière, Xiaochuan Pan. Noise properties of the inverse π-scheme exponential radon transform. In Milan Sonka, J. Michael Fitzpatrick, editors, Medical Imaging 2002: Image Processing, San Diego, California, United States, 23-28 February 2002. Volume 4684 of SPIE Proceedings, SPIE, 2002. [doi]

Abstract

Abstract is missing.