Denis Sidorov, Wong Soon Wei, Igor Vasil ev, Saverio Salerno. Automatic defects classification with p-median clustering technique. In 10th International Conference on Control, Automation, Robotics and Vision, ICARCV 2008, Hanoi, Vietnam, 17-20 December 2008, Proceedings. pages 775-780, IEEE, 2008. [doi]
@inproceedings{SidorovWVS08,
title = {Automatic defects classification with p-median clustering technique},
author = {Denis Sidorov and Wong Soon Wei and Igor Vasil ev and Saverio Salerno},
year = {2008},
doi = {10.1109/ICARCV.2008.4795615},
url = {http://dx.doi.org/10.1109/ICARCV.2008.4795615},
tags = {classification},
researchr = {https://researchr.org/publication/SidorovWVS08},
cites = {0},
citedby = {0},
pages = {775-780},
booktitle = {10th International Conference on Control, Automation, Robotics and Vision, ICARCV 2008, Hanoi, Vietnam, 17-20 December 2008, Proceedings},
publisher = {IEEE},
}