Denis Sidorov, Wong Soon Wei, Igor Vasil ev, Saverio Salerno. Automatic defects classification with p-median clustering technique. In 10th International Conference on Control, Automation, Robotics and Vision, ICARCV 2008, Hanoi, Vietnam, 17-20 December 2008, Proceedings. pages 775-780, IEEE, 2008. [doi]
Abstract is missing.