Thomas Siegert, Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang. A Nonnegative Tensor Factorization Approach for Three-Dimensional Binary Wafer-Test Data. In 15th IEEE International Conference on Machine Learning and Applications, ICMLA 2016, Anaheim, CA, USA, December 18-20, 2016. pages 842-845, IEEE, 2016. [doi]
Abstract is missing.