Estimating second-order Volterra system parameters from noisy measurements based on an LMS variant or an errors-in-variables method

Zoé Sigrist, Eric Grivel, Benoît Alcoverro. Estimating second-order Volterra system parameters from noisy measurements based on an LMS variant or an errors-in-variables method. Signal Processing, 92(4):1010-1020, 2012. [doi]

Abstract

Abstract is missing.