Functional vs. multi-VDD testing of RF circuits

Estella Silva, José Pineda de Gyvez, Guido Gronthoud. Functional vs. multi-VDD testing of RF circuits. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]

Authors

Estella Silva

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José Pineda de Gyvez

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Guido Gronthoud

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