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Electromigration-aware and IR-Drop avoidance routing in analog multiport terminal structures

Ricardo Martins Abreu e Silva, Nuno C. Lourenço, António Canelas, Nuno Horta. Electromigration-aware and IR-Drop avoidance routing in analog multiport terminal structures. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]

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Ricardo Martins Abreu e Silva

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Nuno C. Lourenço

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António Canelas

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Nuno Horta

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