Attention Modules Improve Image-Level Anomaly Detection for Industrial Inspection: A DifferNet Case Study

André Luiz Buarque Vieira e Silva, Francisco Simões, Danny Kowerko, Tobias Schlosser, Felipe Battisti, Veronica Teichrieb. Attention Modules Improve Image-Level Anomaly Detection for Industrial Inspection: A DifferNet Case Study. In IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2024, Waikoloa, HI, USA, January 3-8, 2024. pages 8231-8240, IEEE, 2024. [doi]

Abstract

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