David Silver, David M. Bradley, Scott Thayer. Scan matching for flooded subterranean voids. In 2004 IEEE Conference on Robotics, Automation and Mechatronics, RAM 2004, December 1-3, 2004, Singapore. pages 422-427, IEEE, 2004. [doi]
@inproceedings{SilverBT04, title = {Scan matching for flooded subterranean voids}, author = {David Silver and David M. Bradley and Scott Thayer}, year = {2004}, url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=30991&arnumber=1438957&count=107&index=75}, researchr = {https://researchr.org/publication/SilverBT04}, cites = {0}, citedby = {0}, pages = {422-427}, booktitle = {2004 IEEE Conference on Robotics, Automation and Mechatronics, RAM 2004, December 1-3, 2004, Singapore}, publisher = {IEEE}, }