Scan matching for flooded subterranean voids

David Silver, David M. Bradley, Scott Thayer. Scan matching for flooded subterranean voids. In 2004 IEEE Conference on Robotics, Automation and Mechatronics, RAM 2004, December 1-3, 2004, Singapore. pages 422-427, IEEE, 2004. [doi]

Abstract

Abstract is missing.