Timothy J. Silverman, Steve Johnston. Permanent shunts from passing shadows: Reverse-bias damage in thin-film photovoltaic modules. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 6, IEEE, 2018. [doi]
@inproceedings{SilvermanJ18,
title = {Permanent shunts from passing shadows: Reverse-bias damage in thin-film photovoltaic modules},
author = {Timothy J. Silverman and Steve Johnston},
year = {2018},
doi = {10.1109/IRPS.2018.8353627},
url = {https://doi.org/10.1109/IRPS.2018.8353627},
researchr = {https://researchr.org/publication/SilvermanJ18},
cites = {0},
citedby = {0},
pages = {6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5479-8},
}