Dejene M. Sime, Nan Ouyang, Kai Sheng, Getu T. Fellek, Wenkang Wan, Adnan A. Qaseem, Xiaojiang Ren, Shehui Bu. Saliency-Guided Transformer Attention With Pixel-Level Contrastive Learning for Weakly Supervised Defect Localization. IEEE Trans. Industrial Informatics, 22(4):3376-3387, April 2026. [doi]
Abstract is missing.