Emmanuel Simeu, Anura Puissochet, Jean-Luc Rainard, Anne-Marie Tagant, Michel Poize. A new tool for random testability evaluation using simulation and formal proof. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 321-326, IEEE, 1992. [doi]
@inproceedings{SimeuPRTP92,
title = {A new tool for random testability evaluation using simulation and formal proof},
author = {Emmanuel Simeu and Anura Puissochet and Jean-Luc Rainard and Anne-Marie Tagant and Michel Poize},
year = {1992},
doi = {10.1109/VTEST.1992.232773},
url = {http://dx.doi.org/10.1109/VTEST.1992.232773},
researchr = {https://researchr.org/publication/SimeuPRTP92},
cites = {0},
citedby = {0},
pages = {321-326},
booktitle = {10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA},
publisher = {IEEE},
isbn = {0-7803-0623-6},
}