Emmanuel Simeu, Anura Puissochet, Jean-Luc Rainard, Anne-Marie Tagant, Michel Poize. A new tool for random testability evaluation using simulation and formal proof. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 321-326, IEEE, 1992. [doi]
Abstract is missing.