Marko Simic, Davorin Ambrus, Vedran Bilas. Object Depth Estimation From Line-Scan EMI Data Using Machine Learning. In 2022 IEEE Sensors, Dallas, TX, USA, October 30 - Nov. 2, 2022. pages 1-4, IEEE, 2022. [doi]
@inproceedings{SimicAB22,
title = {Object Depth Estimation From Line-Scan EMI Data Using Machine Learning},
author = {Marko Simic and Davorin Ambrus and Vedran Bilas},
year = {2022},
doi = {10.1109/SENSORS52175.2022.9967098},
url = {https://doi.org/10.1109/SENSORS52175.2022.9967098},
researchr = {https://researchr.org/publication/SimicAB22},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2022 IEEE Sensors, Dallas, TX, USA, October 30 - Nov. 2, 2022},
publisher = {IEEE},
isbn = {978-1-6654-8464-0},
}