Object Depth Estimation From Line-Scan EMI Data Using Machine Learning

Marko Simic, Davorin Ambrus, Vedran Bilas. Object Depth Estimation From Line-Scan EMI Data Using Machine Learning. In 2022 IEEE Sensors, Dallas, TX, USA, October 30 - Nov. 2, 2022. pages 1-4, IEEE, 2022. [doi]

Abstract

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