Marco Simicic, Pieter Weckx, Bertrand Parvais, Philippe Roussel, Ben Kaczer, Georges G. E. Gielen. Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations. IEEE Trans. VLSI Syst., 27(3):601-610, 2019. [doi]
@article{SimicicWPRKG19,
title = {Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations},
author = {Marco Simicic and Pieter Weckx and Bertrand Parvais and Philippe Roussel and Ben Kaczer and Georges G. E. Gielen},
year = {2019},
doi = {10.1109/TVLSI.2018.2878841},
url = {https://doi.org/10.1109/TVLSI.2018.2878841},
researchr = {https://researchr.org/publication/SimicicWPRKG19},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {27},
number = {3},
pages = {601-610},
}