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Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell

Alexandre Simionovski, Rafael Galhardo Vaz, Odair Lelis Goncalez, Gilson I. Wirth. Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell. J. Electronic Testing, 31(4):411-417, 2015. [doi]

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