20 A unifying viewpoint on pattern recognition

J. C. Simon, E. Backer, J. Sallentin. 20 A unifying viewpoint on pattern recognition. In Paruchuri R. Krishnaiah, Laveen N. Kanal, editors, Classification, Pattern Recognition and Reduction of Dimensionality. Volume 2 of Handbook of Statistics, pages 451-477, North-Holland, 1982. [doi]

Abstract

Abstract is missing.