William R. Simpson, John W. Sheppard. System Perspective on Diagnostic Testing. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 547, IEEE Computer Society, 1992.
@inproceedings{SimpsonS92:0,
title = {System Perspective on Diagnostic Testing},
author = {William R. Simpson and John W. Sheppard},
year = {1992},
tags = {testing, diagnostics},
researchr = {https://researchr.org/publication/SimpsonS92%3A0},
cites = {0},
citedby = {0},
pages = {547},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}