William R. Simpson, John W. Sheppard. Fault Isolation in an Integrated Diagnostic Environment. IEEE Design & Test of Computers, 10(1):52-66, 1993. [doi]
@article{SimpsonS93,
title = {Fault Isolation in an Integrated Diagnostic Environment},
author = {William R. Simpson and John W. Sheppard},
year = {1993},
doi = {10.1109/54.199805},
url = {http://doi.ieeecomputersociety.org/10.1109/54.199805},
tags = {rule-based, model-based diagnostics, meta-model, diagnostics, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/SimpsonS93},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {10},
number = {1},
pages = {52-66},
}