Ozgur Sinanoglu. Scan to Nonscan Conversion via Test Cube Analysis. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(2):289-300, 2013. [doi]
@article{Sinanoglu13,
title = {Scan to Nonscan Conversion via Test Cube Analysis},
author = {Ozgur Sinanoglu},
year = {2013},
doi = {10.1109/TCAD.2012.2218603},
url = {http://dx.doi.org/10.1109/TCAD.2012.2218603},
researchr = {https://researchr.org/publication/Sinanoglu13},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {32},
number = {2},
pages = {289-300},
}