Predictive analysis for projecting test compression levels

Ozgur Sinanoglu, Sobeeh Almukhaizim. Predictive analysis for projecting test compression levels. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 275-284, IEEE, 2010. [doi]

Authors

Ozgur Sinanoglu

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Sobeeh Almukhaizim

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