Vishwanath A. Sindagi, Sumit Srivastava. OLED panel defect detection using local inlier-outlier ratios and modified LBP. In 14th IAPR International Conference on Machine Vision Applications, MVA 2015, Miraikan, Tokyo, Japan, 18-22 May, 2015. pages 214-217, IEEE, 2015. [doi]
Abstract is missing.