Suraj Sindia. Innovative practices session 2C: New technologies, new challenges - 2. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1, IEEE, 2015. [doi]
@inproceedings{Sindia15, title = {Innovative practices session 2C: New technologies, new challenges - 2}, author = {Suraj Sindia}, year = {2015}, doi = {10.1109/VTS.2015.7116258}, url = {http://dx.doi.org/10.1109/VTS.2015.7116258}, researchr = {https://researchr.org/publication/Sindia15}, cites = {0}, citedby = {0}, pages = {1}, booktitle = {33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015}, publisher = {IEEE}, isbn = {978-1-4799-7597-6}, }