Suraj Sindia, Vishwani D. Agrawal, Virendra Singh. Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing. J. Electronic Testing, 28(4):541-549, 2012. [doi]
@article{SindiaAS12,
title = {Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing},
author = {Suraj Sindia and Vishwani D. Agrawal and Virendra Singh},
year = {2012},
doi = {10.1007/s10836-012-5305-4},
url = {http://dx.doi.org/10.1007/s10836-012-5305-4},
researchr = {https://researchr.org/publication/SindiaAS12},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {28},
number = {4},
pages = {541-549},
}