Chip Test Optimization Using Defect Clustering Information - researchr publication bibtex

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Adit D. Singh, C. Mani Krishna. Chip Test Optimization Using Defect Clustering Information. In FTCS. pages 366-373, 1992.

@inproceedings{SinghK92,
  title = {Chip Test Optimization Using Defect Clustering Information},
  author = {Adit D. Singh and C. Mani Krishna},
  year = {1992},
  tags = {optimization, testing, C++},
  researchr = {https://researchr.org/publication/SinghK92},
  cites = {0},
  citedby = {0},
  pages = {366-373},
  booktitle = {FTCS},
}

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