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Adit D. Singh, C. Mani Krishna. Chip Test Optimization Using Defect Clustering Information. In FTCS. pages 366-373, 1992.
Possibly Related PublicationsThe following publications are possibly variants of this publication: On the Effect of Defect Clustering on Test Transparency and IC Test OptimizationAdit D. Singh, C. Mani Krishna. TC, 45(6):753-757, 1996.
The following publications are possibly variants of this publication: