Jawar Singh, Jimson Mathew, Saraju P. Mohanty, Dhiraj K. Pradhan. A nano-CMOS process variation induced read failure tolerant SRAM cell. In International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA. pages 3334-3337, IEEE, 2008. [doi]
@inproceedings{SinghMMP08,
title = {A nano-CMOS process variation induced read failure tolerant SRAM cell},
author = {Jawar Singh and Jimson Mathew and Saraju P. Mohanty and Dhiraj K. Pradhan},
year = {2008},
doi = {10.1109/ISCAS.2008.4542172},
url = {http://dx.doi.org/10.1109/ISCAS.2008.4542172},
researchr = {https://researchr.org/publication/SinghMMP08},
cites = {0},
citedby = {0},
pages = {3334-3337},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA},
publisher = {IEEE},
}