A nano-CMOS process variation induced read failure tolerant SRAM cell

Jawar Singh, Jimson Mathew, Saraju P. Mohanty, Dhiraj K. Pradhan. A nano-CMOS process variation induced read failure tolerant SRAM cell. In International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA. pages 3334-3337, IEEE, 2008. [doi]

Abstract

Abstract is missing.