S. Singhal, T. Li, A. Chaudhari, A. W. Hanson, R. Therrien, J. W. Johnson, W. Nagy, J. Marquart, P. Rajagopal, J. C. Roberts. Reliability of large periphery GaN-on-Si HFETs. Microelectronics Reliability, 46(8):1247-1253, 2006. [doi]
Abstract is missing.