Arani Sinha. Innovative Practices Track: Silent Data Errors. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1, IEEE, 2022. [doi]
@inproceedings{Sinha22-3, title = {Innovative Practices Track: Silent Data Errors}, author = {Arani Sinha}, year = {2022}, doi = {10.1109/VTS52500.2021.9794173}, url = {https://doi.org/10.1109/VTS52500.2021.9794173}, researchr = {https://researchr.org/publication/Sinha22-3}, cites = {0}, citedby = {0}, pages = {1}, booktitle = {40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022}, publisher = {IEEE}, isbn = {978-1-6654-1060-1}, }