DFM-aware fault model and ATPG for intra-cell and inter-cell defects - researchr publication authors

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Arani Sinha, Sujay Pandey, Ayush Singhal, Alodeep Sanyal, Alan Schmaltz. DFM-aware fault model and ATPG for intra-cell and inter-cell defects. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]

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