Niraj Sinha, John T. W. Yeow. Modeling of the Behavior of Random Carbon Nanotubes During Field Emission. In 2005 International Conference on MEMS, NANO, and Smart Systems (ICMENS 2005), 24-27 July 2005, Banff, Alberta, Canada. pages 371-376, IEEE Computer Society, 2005. [doi]
Abstract is missing.