Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect

Corrado De Sio, Sarah Azimi, Luca Sterpone, Boyang Du. Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect. IEEE Access, 7:140182-140189, 2019. [doi]

Abstract

Abstract is missing.